# IEEE 期刊列表 - Link: https://www.ixiqin.com/2017/12/27/ieee-journal-list/ - Published: 2017-12-27T12:54:25+08:00 - Author: 白宦成 **A – C** * [Access, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639) * [Aerospace and Electronics Systems Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=62) * [Aerospace and Electronic Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7) * [Affective Computing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5165369) * [Annals of the History of Computing, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=85) * [Antennas and Propagation, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8) * [Antennas and Propagation Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=74) * [Antennas and Wireless Propagation Letters, IEEE * [Applied Superconductivity, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=77) * [Audio, Speech and Language Processing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=10376) * [Automatic Control, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9) * [Automation Science and Engineering, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8856) * [Autonomous Mental Development, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563672) * [Bell Labs Technical Journal](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6731002) * [Biomedical Circuits and Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4156126) * [Biomedical Engineering, IEEE Reviews in](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4664312) * [Biomedical Engineering, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=10) * [Biomedical and Health Informatics, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221020) * [Broadcasting, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=11) * [Circuits and Systems for Video Technology, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=76) * [Circuits and Systems I: Regular Papers, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8919) * [Circuits and Systems II: Express Briefs, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8920) * [Circuits and Systems Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7384) * [Cloud Computing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6245519) * [Communications Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4234) * [Communications Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=35) * [Communications Surveys and Tutorials, IEEE Communications Society](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9739) * [Communications, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=26) * [Components, Packaging and Manufacturing Technology, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5503870) * [Computational Biology and Bioinformatics, IEEE/ACM Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8857) * [Computer](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2) * [Computer Graphics and Applications Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=38) * [Computational Intelligence and AI in Games, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4804728) * [Computational Intelligence Magazine, IEEE](http://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=33585) * [Computational Social Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6570650) * [Computer Architecture Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=10208) * [Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43) * [Computers, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=12) * [Computer Graphics & Applications, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=38) * [Computing in Science & Engineering Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5992) * [Consumer Electronics Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5962380) * [Consumer Electronics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=30) * [Control and Network Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6509490) * [Control Systems Technology, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=87) * [Control Systems Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=37) * [Cybernetics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221036) * [Dependable and Secure Computing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8858) * [Design & Test of Computers, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=54) * [Device and Materials Reliability, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298) * [Dielectrics and Electrical Insulation, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=94) * [Display Technology, IEEE/OSA Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9425) * [Education, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=13) * [Electrical and Computer Engineering, Canadian Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9754) * [Electrification Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6508996) * [Electromagnetic Compatibility, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=15) * [Electromagnetic Compatibility Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5962381) * [Electron Device Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=55) * [Electron Devices, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16) * [Electrical Insulation Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=57) * [Electronic Materials, IEEE/TMS Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7029) * [Embedded Systems Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563995) * [Emerging and Selected Topics in Circuits and Systems, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5503868) * [Emerging Topics on Computing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6245516) * [Emerging and Selected Topics in Power Electronics, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6245517) * [Energy Conversion, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=60) * [Engineering Management, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=17) * [Engineering Management Review, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=46) * [Evolutionary Computation, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4235) * [Fuzzy Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=91) * [Geoscience and Remote Sensing Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8859) * [Geoscience and Remote Sensing Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6245518) * [Geoscience and Remote Sensing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=36) * [Haptics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4543165) * [Human-Machine Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221037) * [Image Processing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=83) * [Industrial Electronics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=41) * [Industrial Electronics Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4154573) * [Industrial Informatics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9424) * [Industry Applications, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=28) * [Industry Applications Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2943) * [Information Forensics and Security, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=10206) * [Information Technology in Biomedicine, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4233) * [Information Theory, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=18) * [Instrumentation and Measurement, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=19) * [Instrumentation and Measurement Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5289) * [Intelligent Systems, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9670) * [Intelligent Transportation Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6979) * [Intelligent Transportation Systems Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5117645) * [Internet Of Things Journal, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6488907) * [Internet Computing, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4236) * [IT Professional](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6294) * [Knowledge and Data Engineering, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=69) * [Latin America Transactions, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9907) * [Learning Technologies, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4620076) * [Lightwave Technology, IEEE/OSA Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=50) * [Magnetics Letters, IEEE](http://ieeexplore.ieee.org/xpl/tocresult.jsp?reload=true&isnumber=5257438) * [Magnetics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20) * [Mechatronics, IEEE/ASME Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=3516) * [Medical Imaging, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=42) * [Micro, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=40) * [Microelectromechanical Systems, IEEE/ASME Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=84) * [Microwave and Wireless Components Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7260) * [Microwave Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6668) * [Microwave Theory and Techniques, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=22) * [Mobile Computing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7755) * [MultiMedia, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=93) * [Multimedia, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6046) * [NanoBioscience, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7728) * [Nanotechnology, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7729) * [Nanotechnology Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4451717) * [Network, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=65) * [Network Science and Engineering, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6488902) * [Network and Service Management, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4275028) * [Networking, IEEE/ACM Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=90) * [Neural Networks and Learning Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5962385) * [Neural Systems and Rehabilitation Engineering, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7333) * [Nuclear Science, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23) * [Oceanic Engineering, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=48) * [Optical Communications and Networking, IEEE/OSA Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563700) * [Parallel and Distributed Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=71) * [Pattern Analysis and Machine Intelligence, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=34) * [Pervasive Computing, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7756) * [Photonics Journal, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563994) * [Photonics Technology Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=68) * [Photovoltaics, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5503869) * [Plasma Science, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=27) * [Potentials, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=45) * [Power Delivery, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=61) * [Power & Energy Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8014) * [Power Electronics Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6570649) * [Power Electronics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=63) * [Power Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=59) * [Proceedings of the IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5) * [Professional Communication, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=47) * [Pulse, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5454060) * [Quantum Electronics, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=3) * [Reliability, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=24) * [Robotics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8860) * [Robotics & Automation Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=100) * [Selected Areas in Communications, IEEE Journal on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=49) * [Security and Privacy Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8013) * [Selected Topics in Applied Earth Observations and Remote Sensing, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4609443) * [Selected Topics in Signal Processing, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4200690) * [Selected Topics in Quantum Electronics, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2944) * [Semiconductor Manufacturing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=66) * [Sensors Journal, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7361) * [Services Computing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4629386) * [Signal Processing Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=97) * [Signal Processing, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=78) * [Signal Processing Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=79) * [Smart Grid, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5165411) * [Software Engineering, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=32) * [Solid-State Circuits, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4) * [Solid-State Circuits Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563670) * [Software Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=52) * [Spectrum, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6) * [Sustainable Energy, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5165391) * [Systems Engineering and Electronics, Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5971804) * [Systems Journal, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4267003) * [Systems, Man, amd Cybernetics: Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221021) * [Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=3468) * [Systems, Man and Cybernetics, Part B: Cybernetics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=3477) * [Systems, Man and Cybernetics, Part C: Applications and Reviews, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5326) * [Technology and Society Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=44) * [Terahertz Science and Technology, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5503871) * [Translational Engineering in Health and Medicine, IEEE Journal of](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221039) * [Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=58) * [Vehicular Technology, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=25) * [Vehicular Technology Magazine, IEEE](http://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=34840) * [Very Large Scale Integration (VLSI) Systems, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=92) * [Visualization and Computer Graphics, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2945) * [Wireless Communications Letters, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5962382) * [Wireless Communications, IEEE Transactions on](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7693) * [Wireless Communications Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7742) * [Women in Engineering Magazine, IEEE](http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4509581)